Electronic and geometric structure of thin CoO(100) films studied by angle-resolved photoemission spectroscopy and Auger electron diffraction

被引:18
|
作者
Heiler, M
Chassé, A
Schindler, KM [1 ]
Hollering, M
Neddermeyer, H
机构
[1] Univ Halle Wittenberg, Fachbereich Phys, D-06099 Halle, Germany
[2] Univ Erlangen Nurnberg, Inst Tech Phys, D-91058 Erlangen, Germany
关键词
angle resolved photoemission; Auger electron diffraction; cobalt oxides;
D O I
10.1016/S0039-6028(00)00075-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have prepared ordered thin films of CoO by evaporating cobalt in an O-2 atmosphere on to a heated (500 K) Ag(100) substrate. The geometric and electronic structure of the films was characterized by means of Auger electron diffraction (AED) and angle-resolved photoemission spectroscopy (ARUPS), respectively. The experimental AED results were compared with simulated data, which showed that the film grows in (100) orientation on the Ag(100) substrate. Synchrotron-radiation-induced photoemission investigations were performed in the photon energy range from 25 eV to 67 eV. The dispersion of the transitions was found to be similar to that of previous results on a single-crystal CoO(100) surface. The resonance behaviour of the photoemission lines in the valence-band region was investigated by constant-initial-state (CIS) spectroscopy. The implications of this behaviour for assignment of the photoemission lines to specific electronic transitions is discussed and compared with published theoretical models of the electronic structure. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:36 / 40
页数:5
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