Super-resolution near-field ptychography

被引:19
|
作者
Xu, Wenhui [1 ,2 ]
Lin, Huixiang [1 ]
Wang, Hangyu [1 ]
Zhang, Fucai [1 ]
机构
[1] Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
[2] Harbin Inst Technol, Harbin 150001, Peoples R China
来源
OPTICS EXPRESS | 2020年 / 28卷 / 04期
基金
中国国家自然科学基金;
关键词
WIDE-FIELD; RAY; MICROSCOPY;
D O I
10.1364/OE.383986
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Compared to far-field ptychography, near-field ptychography can reduce the requirement on the detector dynamic range, while it is able to cover a larger field of view with a fewer number of sample scans. However, its spatial resolution is limited by the detector pixel size. Here, we utilize a pixel-super-resolved approach to overcome this limitation. The method has been applied to four types of experiment configurations using planar and divergent illuminations together with two different cameras with highly contrast specifications. The proposed method works effectively for up-sampling up to 6 times. Meanwhile, it can achieve similar to 5.9-fold and similar to 3.1-fold resolution improvement over the 6.5-mu m and 2.4-mu m detector pixel size. We also demonstrate the precisely quantitative phase imaging capability of the method by using a phase resolution target. The presented method is believed to have great potential in X-ray tomography and on-chip flow cytometry. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:5164 / 5178
页数:15
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