Crystal structures on growth of Pr0.7Ca0.3MnO3 thin films analyzed by transmission electron microscope

被引：3
|
作者：
Moon, H. B.
Kim, C. H.
Min, S. S.
Ahn, J. S.
Cho, J. H. [1 ]
机构：
[1] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea
[2] Pusan Natl Univ, RCDAMP, Pusan 609735, South Korea
[3] Natl Ctr Nanomat Technol, Pohang 790784, South Korea
[4] Korea Stand Res Inst & Sci, Taejon 305340, South Korea
来源：
JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2007年 / 51卷
关键词：
PCMO; RRAM; PLD; strain; TEM;
D O I：
10.3938/jkps.51.147
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Pr0.7Ca0.3MnO3 (PCMO) thin films on SrTiO3 (001) substrates were prepared by pulsed laser deposition. We used two different cooling conditions: quenched and slow-cooled. The cross sections of the. PCMO films were investigated thoroughly by transmission electron microscope (TEM) observations in high-resolution electron microscopy (HREM) and electron diffraction (ED). The microstructure of the ED patterns and HREM images indicated (010) epitaxial growth. We found a correlation between the strain relaxation and crystal structure related to the cooling conditions.
引用
收藏
页码：S147 / S150
页数：4
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