Simulation of the Geiger mode operation of a single photon detection avalanche photodiode

Detection efficiency and dark count of a Geiger mode single photon detection avalanche photodiode was studied by a numerical simulation. The ionization process triggered by a single hole injection was simulated at a bias voltage slightly greater than the avalanche breakdown voltage for calculation of the detection efficiency. Tunneling effect in the multiplication layer was taken into account for the dark count simulation. In the gated-mode operation, the avalanche build-up time also affects on the signal to noise ratio. The multiplication layer thickness is a key parameter for the device performances.