Dielectric breakdown patterns and active walker model

被引:13
|
作者
Sheu, CR [1 ]
Cheng, CY [1 ]
Pan, RP [1 ]
机构
[1] Natl Chiao Tung Univ, Dept Electrophys, Hsinchu 30050, Taiwan
来源
PHYSICAL REVIEW E | 1999年 / 59卷 / 02期
关键词
D O I
10.1103/PhysRevE.59.1540
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Simulations based on the active walker model an used successfully to reconstruct the dielectric breakdown patterns observed in a cell with parallel-plate electrodes. Different types of patterns can be obtained with suitable parameters. These parameters correspond to the electrical and environmental conditions during the breakdown.
引用
收藏
页码:1540 / 1544
页数:5
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