Anisotropic behaviour and negative refraction in stacked subwavelength hole arrays metamaterials

被引：0

作者：

Navarro-Cia, M. ^{[1
]}

Beruete, M. ^{[1
]}

Falcone, F. ^{[1
]}

Sorolla, M. ^{[1
]}

Campillo, I. ^{[2
]}

机构：

[1] Univ Publ Navarra, Millimetre & Terahertz Waves Lab, Campus Arrosadia, Pamplona 31006, Spain

[2] 2CIC nanoGUNE Consolider, Donostia San Sebastian 20018, Spain

来源：

PROCEEDINGS OF THE FOURTH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION | 2010年

关键词：

EXTRAORDINARY OPTICAL-TRANSMISSION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Oblique incidence on a stack of subwavelength hole arrays wafers is analyzed both from simulation and measurement. A strong anisotropic behaviour is observed giving as a result that for P-polarized illumination, the refracted beam emerges at negative angles whereas for S-polarized illumination it is at positive angles. Two-dimensional dispersion diagrams are calculated to predict qualitatively the performance of the structure in terms of the refraction, which is subsequently demonstrated with experiments in the millimetre-wave range.

引用

页数：3

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