Laser-induced damage in a silicon-based photodiode by MHz picosecond laser

被引:7
|
作者
Wang, Kaixuan [1 ]
Yu, Xuyang [1 ]
Li, Pingxue [1 ]
Wang, Tingting [1 ]
Zhang, Yuefei [2 ]
Li, Chunyong [3 ]
机构
[1] Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
[2] Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
[3] Univ Durham, Dept Phys, South Rd, Durham DH1 3LE, England
基金
中国国家自然科学基金;
关键词
silicon-based photodetector; hundred-picosecond laser; damage threshold; thermal and plasma; PERFORMANCE; DEGRADATION; ABLATION;
D O I
10.1088/1555-6611/ab92aa
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Study of the damage characteristics of silicon-based photodetectors is of great significance in improving application performance, but few studies of laser-induced damage have been undertaken on photodetectors irradiated by hundred-ps fiber lasers. In this work, we demonstrate an all-fiber ps-pulsed laser system which outputs a pulse width of 226.5 ps and an average power of 20 W at 2.4 MHz repetition rate, with high beam quality and pulse stability. Experiments use this fiber amplifier to irradiate a silicon-based positive-intrinsic-negative (PIN) photodiode. The changes in detector performance and surface morphology are confirmed by systematic experiments on the laser-irradiated detector. The results show that detection performance was sensitive to laser energy, and the failure damage threshold was about 864 kW cm(-2). Based on hydrodynamics theory, we simulated the laser-induced plasma density distribution in a PIN photodiode and studied the thermal and plasma damage mechanisms in the PIN photodiode.
引用
收藏
页数:6
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