Broadband characterization of the nonlinear refractive index of sapphire

被引：0
|
作者：
Major, A [1 ]
Yoshino, F [1 ]
Nikolakakos, I [1 ]
Aitchison, JS [1 ]
Smith, PWE [1 ]
机构：
[1] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
来源：
2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 | 2003年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：405 / 406
页数：2
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