Improving supply chain visibility through RFID data

被引：3
|
作者：
Melski, Adam [1 ]
Willer, Juergen [2 ]
Zeier, Alexander [2 ]
Schumann, Matthias
机构：
[1] Univ Gottingen, Inst Informat Syst, Pl Gottinger Sieben 5, D-37073 Gottingen, Germany
[2] Univ Potsdam, Hasso Plattner Inst Software Syst Engn, D-14482 Potsdam, Germany
来源：
2008 IEEE 24TH INTERNATIONAL CONFERENCE ON DATA ENGINEERING WORKSHOP, VOLS 1 AND 2 | 2008年
关键词：
D O I：
10.1109/ICDEW.2008.4498295
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In our work, which is still in progress, we examine the visibility potentials of RFID technology within the context of Supply Chain Management (SCM). This analysis is conducted systematically by matching identified SCM visibility requirements and general RFID visibility potentials. Building on a four-step approach, we show how visibility in supply chains can be improved on the basis of RFID-generated data, and what impact this increase in visibility has on the goals of SCM.
引用
收藏
页码：102 / +
页数：2
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