Polymer Nanostructured Components Machined Directly by the Atomic Force Microscopy Scratching Method

被引:13
|
作者
Yan, Yong Da [1 ,2 ]
Gao, Da Wei [1 ,2 ]
Hu, Zhen Jiang [2 ]
Sen Zhao, Xue [2 ]
Yan, Jiu Chun [2 ]
机构
[1] Harbin Inst Technol, Inst Robot, State Key Lab Robot & Syst, Harbin 150080, Peoples R China
[2] Harbin Inst Technol, Ctr Precis Engn, Harbin 150001, Heilongjiang, Peoples R China
关键词
Atomic Force Microscopy (AFM); Taguchi method; Nanomechanical scratching; Nanostructures; SCANNING PROBE LITHOGRAPHY; NANOMETER-SCALE; SURFACE; TIP; NANOLITHOGRAPHY; NANOSCALE; AFM;
D O I
10.1007/s12541-012-0033-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This study aims to machine complex three dimensional nano-structures on polymer surfaces directly using the Atomic Force Microscopy (AFM)-based nano-mechanical processing method. Processing parameters including the normal load, the feed rate, the machining speed and the scanning direction are optimized by the Taguchi method. Their effects on the machined depth and the surface roughness of the machined structures are analyzed. Meanwhile, the AFM PZT tube is controlled to achieve the tip's three-dimensional motions in space. Using the optimized processing parameters. three-dimensional nanostructures on the surface of PMMA are directly fabricated. It is a novel low-cost manufacturing method for machining complex three-dimensional nano-structures or nano parts on polymer sum faces directly.
引用
收藏
页码:269 / 273
页数:5
相关论文
共 50 条
  • [1] Polymer nanostructured components machined directly by the atomic force microscopy scratching method
    Yong Da Yan
    Wei Da Gao
    Zhen Jiang Hu
    Xue Sen Zhao
    Jiu Chun Yan
    [J]. International Journal of Precision Engineering and Manufacturing, 2012, 13 : 269 - 273
  • [2] Development of a Novel Process Chain Based on Atomic Force Microscopy Scratching for Small and Medium Series Production of Polymer Nanostructured Components
    Brousseau, E. B.
    Krohs, F.
    Caillaud, E.
    Dimov, S.
    Gibaru, O.
    Fatikow, S.
    [J]. JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME, 2010, 132 (03): : 0309011 - 0309018
  • [3] Scratching the surface: Fundamental investigations of tribology with atomic force microscopy
    Carpick, RW
    Salmeron, M
    [J]. CHEMICAL REVIEWS, 1997, 97 (04) : 1163 - 1194
  • [4] Assessment of Coating Adhesion Degradation by Atomic Force Microscopy Scratching
    Seong, J.
    Frankel, G. S.
    [J]. CORROSION, 2012, 68 (03)
  • [5] Atomic force microscopy of polymer crystals
    Estrada, RF
    Arenas, J
    Macias, S
    Rodriguez-Mijangos, R
    Rodrigez, R
    Castano, VM
    [J]. ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION, 1998, : 503 - 504
  • [6] Wear mechanisms in reciprocal scratching of polycarbonate, studied by atomic force microscopy
    Khurshudov, A
    Kato, K
    [J]. WEAR, 1997, 205 (1-2) : 1 - 10
  • [7] Investigation of a new process chain based on atomic force microscopy scratching
    Brousseau, E. B.
    Krohs, F.
    Dimov, S.
    Griffiths, C.
    Scholz, S.
    Rees, A.
    Fatikow, S.
    [J]. 4M/ICOMM 2009 - THE GLOBAL CONFERENCE ON MICRO MANUFACTURE, 2009, : 267 - 270
  • [8] Scratching the surface: Imaging interfacial structure using atomic force microscopy
    Mackie, AR
    Gunning, AP
    Wilde, PJ
    Morris, VJ
    [J]. FOOD COLLOIDS: FUNDAMENTALS OF FORMULATION, 2001, (258): : 13 - 21
  • [9] Understanding the plasmonics of nanostructured atomic force microscopy tips
    Sanders, A.
    Bowman, R. W.
    Zhang, L.
    Turek, V.
    Sigle, D. O.
    Lombardi, A.
    Weller, L.
    Baumberg, J. J.
    [J]. APPLIED PHYSICS LETTERS, 2016, 109 (15)
  • [10] Atomic-force microscopy and photoluminescence of nanostructured CdTe
    V. Babentsov
    F. Sizov
    J. Franc
    A. Luchenko
    E. Svezhentsova
    Z. Tsybrii
    [J]. Semiconductors, 2013, 47 : 1198 - 1202