A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes

被引:34
|
作者
Fan, Mengfei [1 ]
Zeng, Zhiguo [2 ]
Zio, Enrico [2 ,3 ]
Kang, Rui [1 ]
Chen, Ying [1 ]
机构
[1] Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100083, Peoples R China
[2] Univ Paris Saclay, Cent Supelec, Lab Genie Ind, Chair Syst Sci & Energy Challenge,Fdn Elect Franc, F-4103 Gif Sur Yvette, France
[3] Politecn Milan, Energy Dept, I-20133 Milan, Italy
基金
中国国家自然科学基金;
关键词
Degradation; dependent competing failure processes; Markov chain Monte Carlo; particle filtering; prognostics; random shocks; remaining useful life; SYSTEMS SUBJECT; SHOCK MODEL; RELIABILITY; DEGRADATION; MAINTENANCE; DISTRIBUTIONS; PROGNOSTICS; PARAMETER; STATE;
D O I
10.1109/TR.2018.2874459
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A sequential Bayesian approach is presented for remaining useful life (RUL) prediction of dependent competing failure processes (DCFP). The DCFP considered comprises of soft failure processes due to degradation and hard failure processes due to random shocks, where dependency arises due to the abrupt changes to the degradation processes brought by the random shocks. In practice, random shock processes are often unobservable, which makes it difficult to accurately estimate the shock intensities and predict the RUL. In the proposed method, the problem is solved recursively in a two-stage framework: in the first stage, parameters related to the degradation processes are updated using particle filtering, based on the degradation data observed through condition monitoring; in the second stage, the intensities of the random shock processes are updated using the Metropolis-Hastings algorithm, considering the dependency between the degradation and shock processes, and the fact that no hard failure has occurred. The updated parameters are, then, used to predict the RUL of the system. Two numerical examples are considered for demonstration purposes and a real dataset from milling machines is used for application purposes. Results show that the proposed method can be used to accurately predict the RUL in DCFP conditions.
引用
收藏
页码:317 / 329
页数:13
相关论文
共 50 条
  • [1] Degradation modeling and remaining useful life prediction for dependent competing failure processes
    Yan, Tao
    Lei, Yaguo
    Li, Naipeng
    Wang, Biao
    Wang, Wenting
    [J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 2021, 212
  • [2] Bayesian Approach for Remaining Useful Life Prediction
    Mosallam, Ahmed
    Medjaher, Kamal
    Zerhouni, Nourredine
    [J]. 2013 PROGNOSTICS AND HEALTH MANAGEMENT CONFERENCE (PHM), 2013, 33 : 139 - 144
  • [3] A Sequential Bayesian Updated Wiener Process Model for Remaining Useful Life Prediction
    Li, Tianmei
    Pei, Hong
    Pang, Zhenan
    Si, Xiaosheng
    Zheng, Jianfei
    [J]. IEEE ACCESS, 2020, 8 : 5471 - 5480
  • [4] Remaining Useful Life Prediction for Degradation Processes With Dependent and Nonstationary Increments
    Zhang, Hanwen
    Jia, Chao
    Chen, Maoyin
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 70
  • [5] Integrated Bayesian Framework for Remaining Useful Life Prediction
    Mosallam, A.
    Medjaher, K.
    Zerhouni, N.
    [J]. 2014 IEEE CONFERENCE ON PROGNOSTICS AND HEALTH MANAGEMENT (PHM), 2014,
  • [6] Lithium-ion battery remaining useful life prediction based on sequential Bayesian updating
    Zhao, Fei
    Guo, Ming
    Liu, Xuejuan
    [J]. Jisuanji Jicheng Zhizao Xitong/Computer Integrated Manufacturing Systems, CIMS, 2024, 30 (02): : 635 - 642
  • [7] A degradation-shock dependent competing failure processes based method for remaining useful life prediction of drill bit considering time-shifting sudden failure threshold
    Feng, Tingting
    Li, Shichao
    Guo, Liang
    Gao, Hongli
    Chen, Tao
    Yu, Yaoxiang
    [J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 2023, 230
  • [8] Remaining Useful Life Prediction for Multi-Component Stochastic Degrading Equipment under Competing Failure
    Huiqin Li
    Zhengxin Zhang
    Tianmei Li
    Xiaosheng Si
    [J]. 2023 IEEE 12TH DATA DRIVEN CONTROL AND LEARNING SYSTEMS CONFERENCE, DDCLS, 2023, : 318 - 323
  • [9] Remaining Useful Life Prediction for Degradation Processes With Memory Effects
    Xi, Xiaopeng
    Chen, Maoyin
    Zhou, Donghua
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 2017, 66 (03) : 751 - 760
  • [10] Remaining useful life prediction of system based on Bayesian fusion and simulation
    Song Z.
    Jia X.
    Guo B.
    Cheng Z.
    [J]. Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics, 2021, 43 (06): : 1706 - 1713