Electronic Band Structure and Sub-band-gap Absorption of Nitrogen Hyperdoped Silicon

被引:33
|
作者
Zhu, Zhen [1 ]
Shao, Hezhu [1 ]
Dong, Xiao [1 ]
Li, Ning [2 ]
Ning, Bo-Yuan [1 ]
Ning, Xi-Jing [3 ]
Zhao, Li [2 ]
Zhuang, Jun [1 ]
机构
[1] Fudan Univ, Shanghai Ultraprecis Opt Mfg Engn Ctr, Dept Opt Sci & Engn, Shanghai 200433, Peoples R China
[2] Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
[3] Fudan Univ, Inst Modern Phys, Dept Nucl Sci & Technol, Appl Ion Beam Phys Lab, Shanghai 200433, Peoples R China
来源
SCIENTIFIC REPORTS | 2015年 / 5卷
关键词
INFRARED-ABSORPTION; FEMTOSECOND; DIFFUSION;
D O I
10.1038/srep10513
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
We investigated the atomic geometry, electronic band structure, and optical absorption of nitrogen hyperdoped silicon based on first-principles calculations. The results show that all the paired nitrogen defects we studied do not introduce intermediate band, while most of single nitrogen defects can introduce intermediate band in the gap. Considering the stability of the single defects and the rapid resolidification following the laser melting process in our sample preparation method, we conclude that the substitutional nitrogen defect, whose fraction was tiny and could be neglected before, should have considerable fraction in the hyperdoped silicon and results in the visible sub-band-gap absorption as observed in the experiment. Furthermore, our calculations show that the substitutional nitrogen defect has good stability, which could be one of the reasons why the sub-band-gap absorptance remains almost unchanged after annealing.
引用
收藏
页数:9
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