Dielectric response process in relaxor ferroelectrics

被引:18
|
作者
Gui, H [1 ]
Zhang, XW [1 ]
Gu, BL [1 ]
机构
[1] TSING HUA UNIV,CHINESE CTR ADV SCI & TECHNOL,WORLD LAB,DEPT PHYS,BEIJING 100084,PEOPLES R CHINA
关键词
D O I
10.1063/1.117522
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dielectric constant epsilon*(omega,T) = epsilon'(omega,T) + i epsilon ''(omega,T) of relaxer ferroelectrics is simulated by the Monte Carlo method. It is proved that the polar microregions switch among different polarization directions as a whole under the electrical field, giving rise to the high dielectric constant. The relaxer characteristics are caused by the randomly distributed interactions between the polar microregions. Factors which influence the dielectric response process are discussed. (C) 1996 American Institute of Physics.
引用
收藏
页码:2353 / 2355
页数:3
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