Measurement of high-resolution recrystallization textures in nickel sheets using high-energy synchrotron radiation

被引：3
|
作者：
Klein, H [1 ]
Preusser, A
Raue, L
Bunge, HJ
机构：
[1] Univ Gottingen, Dept Crystallog, D-3400 Gottingen, Germany
[2] Tech Univ Clausthal, Dept Phys & Phys Techn, Clausthal Zellerfeld, Germany
来源：
ICOTOM 14: TEXTURES OF MATERIALS, PTS 1AND 2 | 2005年 / 495-497卷
关键词：
recrystallization; high energy synchrotron radiation; high angular resolution; area detector sweeping technique;
D O I：
10.4028/www.scientific.net/MSF.495-497.137
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The new developed "sweeping detector" techniques using high energy synchrotron radiation allow to measure textures and microstructures of materials and their change during heat treatment with high location and orientation resolution. Here we show these new methods applied to cold rolled and subsequently annealed nickel samples. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. The results of these measurements can be the base for comprehensive recrystallization theories.
引用
收藏
页码：137 / 142
页数：6
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