Spectral analytical system for measuring time-resolved spectra of materials under shock

A spectral analytical system has been developed for measuring the time-resolved spectra of a transient emission. In this system, a special optical splitter-delay generator converts the time-distribution spectra into the space-distribution spectra, and the time-dependent spectra are recorded by a two-dimensional charge coupled device, accompanied with a multichannel plate intensifier. The time resolution of 20 ns and the recording time of 120 ns have been achieved in the experiment for argon emission shocked to 12 000 K. (C) 2003 American Institute of Physics.