An accurate model for the thin film flow

被引:0
|
作者
Abderahmane, Hamid Ait [1 ]
Vatistas, Georgios H. [1 ]
机构
[1] Concordia Univ, Dept Mech & Ind Engn, Montreal, PQ H3G 1M8, Canada
关键词
liquid film; linear stability; fow model;
D O I
10.1007/s10409-008-0149-y
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
This paper deals with the linear stability of a liquid film flowing down an inclined plane. The Navier-Stokes equations were reduced into four evolution equations that describe the development of the film depth, the flow rate, the free surface velocity, and the wall shear stress, using the Karman-Polhausen boundary layer integral method. Thus, we were able to determine the stability threshold and approach well the critical wave number for long waves. The obtained results were found to be in good agreement with the experiments of Liu et al.
引用
收藏
页码:375 / 380
页数:6
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