Atomic-scale studies of (a plus c)-type dislocation dissociation in wurtzite GaN

被引:2
|
作者
Xiong, Huan [1 ,2 ]
Wu, Jiejun [3 ]
Fang, Zhilai [1 ]
机构
[1] Fudan Univ, Engn Res Ctr Adv Lighting Technol, Minist Educ, Shanghai 200433, Peoples R China
[2] Sino Nitride Semicond Co Ltd, Res Dept GaN Substrate, Dongguan 523500, Peoples R China
[3] Peking Univ, Sch Phys, Res Ctr Wide Gap Semicond, State Key Lab Artificial Microstruct & Mesoscop P, Beijing 100871, Peoples R China
基金
中国国家自然科学基金;
关键词
D O I
10.7567/APEX.11.025502
中图分类号
O59 [应用物理学];
学科分类号
摘要
We performed atomistic modeling and simulations on (a + c)-type dislocations of various core configurations in wurtzite GaN. The atomic-scale stress distribution around the dislocation cores in GaN was for the first time computed using a large-scale atomic/molecular massively parallel simulator. We confirmed from a theoretical viewpoint that the double 5/6-atom ring core structure is stable, whereas the 5/7-atom ring core naturally dissociates. The dissociation of (a + c)-type dislocations with the 5/7-atom ring core structure intrinsically originates from the anisotropy of local atom stress instead of impurities around dislocation cores. (C) 2018 The Japan Society of Applied Physics
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页数:4
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