Two-tier Bloom filter to achieve faster membership testing

被引：5

作者：

Jimeno, M. ^{[1
]}

Christensen, K. J. ^{[1
]}

Roginsky, A. ^{[2
]}

机构：

[1] Univ S Florida, Dept Comp Sci & Engn, Tampa, FL 33620 USA

[2] NIST, Comp Secur Div, Gaithersburg, MD 20899 USA

来源：

ELECTRONICS LETTERS | 2008年 / 44卷 / 07期

关键词：

D O I：

10.1049/el:20080081

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Testing for element membership in a Bloom filter requires hashing of a test element (e.g. a string) and multiple lookups in memory. A design of a new two-tier Bloom filter with on-chip hash functions and cache is described. For elements with a heavy-tailed distribution for popularity, membership testing time can be significantly reduced.

引用

页码：503 / 504

页数：2

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