Silica films were grown on polyimide substrate using surface sol-gel reaction, and the film growth process was characterized by ellipsometry, atomic force microscopy, and X-ray photoelectron spectroscopy. On the activated polyimide surface, silica film was grown by sequential immersion in SiCl(4) solution and H(2)O. The thickness of silica films is linear with the depositing cycle, about 5.0 nm per cycle. The silica films present an island-like growth type and are not a strict equilibrium SiO(2) structure. Moreover, the result of the tensile test suggests that the silica films have a good adhesion to the polyimide substrate.
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Yeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea
Yeungnam Univ, Program BK21, Kyongsan 712749, South KoreaYeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea
Kwon, Se Jin
Hwang, Cho Rong
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Korea Res Inst Chem Technol, Taejon 305600, South KoreaYeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea
Hwang, Cho Rong
Jang, A-Reum
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Yeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea
Yeungnam Univ, Program BK21, Kyongsan 712749, South KoreaYeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea
Jang, A-Reum
Bae, Jun
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Yeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea
Yeungnam Univ, Program BK21, Kyongsan 712749, South KoreaYeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea
Bae, Jun
Chae, Boknam
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Pohang Accelerator Lab, Beamline Div, Pohang 790784, South KoreaYeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea
Chae, Boknam
Won, Jong Chan
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Korea Res Inst Chem Technol, Taejon 305600, South KoreaYeungnam Univ, Sch Chem Engn, Kyongsan 712749, South Korea