Effects of dielectric properties and microstructures on microwave-vacuum drying of mushroom (Agaricus bisporus) caps and stipes evaluated by non-destructive techniques

This research work aimed to investigate the effects of microstructures, dielectric property and temperature distributions on drying feature difference between the mushroom cap and stipe during the microwave-vacuum drying (MVD) process. Near-infrared hyperspectral imaging (NIR HSI) was employed to visualize distribution maps for moisture content (MC), dielectric constant epsilon' and dielectric loss factor epsilon" of mushroom slices during the MVD process. Infrared (IR) thermal imaging was used to evaluate the temperature distribution of the mushroom slices. Results demonstrated higher MC, epsilon' and epsilon" values in MVD mushroom stipes. Nevertheless, the centre area of the mushroom slice showed the highest temperature, while the MVD mushroom cap displayed a more porous structure. The effect of microstructure could encounter effects of dielectric properties and temperature to cause higher water evaporation in the MVD cap. This work highlights the novelty to combine different detection techniques to investigate the effects of microstructures, dielectric property and temperature distributions on drying patterns of mushroom slices.