Continuous Height-restricted Solid-on-solid Model in Higher Dimensions

被引:0
|
作者
Kim, Sang-Woo [1 ]
Kim, Jin Min [1 ]
机构
[1] Soongsil Univ, Dept Phys, Seoul 156743, South Korea
基金
新加坡国家研究基金会;
关键词
Restricted solid-on-solid model; Surface roughness; growth exponent; Upper critical dimension; Kardar-Parisi-Zhang equation; DIRECTED POLYMERS;
D O I
10.3938/jkps.65.1729
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A continuous height-restricted solid-on-solid model is introduced to reduce the artifact of the discrete height model. The interface width W(t) grows as t(beta) at the beginning and becomes saturated with L-alpha for t >> L-z, where z is the dynamic exponent. Through a numerical simulation of the model, the growth exponent beta for dimension d = 4 + 1, 5 + 1, 6 + 1, and 7 + 1 and the roughness exponent alpha for d = 4 + 1 and 5 + 1 are obtained. They satisfy the scaling relation alpha + z = 2 very well for both d = 4+ 1 and d = 5 + 1. Our results show that the upper critical dimension of the Kardar-Parisi-Zhang equation is higher than d = 7 + 1.
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页码:1729 / 1732
页数:4
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