Calibrated complex impedance and permittivity measurements with scanning microwave microscopy (vol 25, 145703, 2014)

被引：3
|
作者：
Gramse, G. [1 ]
Kasper, M. [1 ]
Fumagalli, L. [3 ,4 ]
Gomila, G. [3 ,4 ]
Hinterdorfer, P. [1 ]
Kienberger, F. [2 ]
机构：
[1] Johannes Kepler Univ Linz, Inst Biophys, A-4020 Linz, Austria
[2] Agilent Technol Austria GmbH, Measurement Res Lab, A-4020 Linz, Austria
[3] Univ Barcelona, Dept Elect, E-08028 Barcelona, Spain
[4] Inst Bioengn Catalunya IBEC, E-08028 Barcelona, Spain
来源：
NANOTECHNOLOGY | 2015年 / 26卷 / 14期
关键词：
D O I：
10.1088/0957-4484/26/14/149501
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页数：1
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