Estimations of parameters in Pareto reliability model in the presence of masked data

被引:40
|
作者
Sarhan, AM [1 ]
El-Gohary, AI [1 ]
机构
[1] Mansoura Univ, Fac Sci, Dept Math, Mansoura 35516, Egypt
关键词
masked data; reliability; Pareto distribution; symmetrical triangular distribution; Bayes procedure; maximum likelihood procedure;
D O I
10.1016/S0951-8320(03)00125-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Estimations of parameters included in the individual distributions of the life times of system components in a series system are considered in this paper based on masked system life test data. We consider a series system of two independent components each has a Pareto distributed lifetime. The maximum likelihood and Bayes estimators for the parameters and the values of the reliability of the system's components at a specific time are obtained. Symmetrical triangular prior distributions are assumed for the unknown parameters to be estimated in obtaining the Bayes estimators of these parameters. Large simulation studies are done in order: (i) explain how one can utilize the theoretical results obtained; (ii) compare the maximum likelihood and Bayes estimates obtained of the underlying parameters; and (iii) study the influence of the masking level and the sample size on the accuracy of the estimates obtained. (C) 2003 Elsevier Ltd. All rights reserved.
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页码:75 / 83
页数:9
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