A New Probe for Electromagnetic Compatibility and Electromagnetic Interference Detection

被引：1
|
作者：
Xiao, Ke [1 ]
Chen, Zhirun [1 ]
Zheng, Wei [1 ]
机构：
[1] Chongqing Univ, Coll Optoelect Engn, Chongqing, Peoples R China
来源：
2020 5TH INTERNATIONAL CONFERENCE ON MECHANICAL, CONTROL AND COMPUTER ENGINEERING (ICMCCE 2020) | 2020年
关键词：
Probe; electromagnetic interference; electromagnetic compatibility; conductor backed coplanar waveguide; NEAR-FIELD PROBES;
D O I：
10.1109/ICMCCE51767.2020.00026
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, a new probe for electromagnetic compatibility and electromagnetic interference detection is proposed, designed, and simulated. ANSYS HFSS software is used to design a 3D model and simulate the probe. The simulation result shows that the working frequency band is up to 3 GHz and spatial resolution is less than 4 mm for magnetic and electric field detection. These parameters show a good ability for locating the interference source. The new structure is able to measure the electric and magnetic field simultaneously, improve the efficiency of the near field detection greatly.
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页码：85 / 88
页数：4
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