The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

被引：12

作者：

Pena-Fernandez, M. ^{[1
]}

Lindoso, A. ^{[2
]}

Entrena, L. ^{[2
]}

Garcia-Valderas, M. ^{[2
]}

机构：

[1] Arquimea Ingn SLU, Leganes 28919, Spain

[2] Univ Carlos III Madrid, Dept Elect Technol, Leganes 28911, Spain

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2020年 / 67卷 / 01期

关键词：

ARM; fault diagnosis; fault tolerance; microprocessor trace; single-event effects; MICROBEAM;

D O I：

10.1109/TNS.2019.2956204

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This work proposes a methodology to diagnose radiation-induced faults in a microprocessor using the hardware trace infrastructure. The diagnosis capabilities of this approach are demonstrated for an ARM microprocessor under neutron and proton irradiation campaigns. The experimental results demonstrate that the execution status in the precise moment that the error occurred can be reconstructed, so that error diagnosis can be achieved.

引用

页码：126 / 134

页数：9

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