Global confidence from identifiability in the Si system

被引：1
|
作者：
Vollard, A [1 ]
机构：
[1] Sevre, Paris, France
来源：
MEASUREMENT TECHNIQUES | 2005年 / 48卷 / 07期
关键词：
Physical Chemistry; Analytical Chemistry; Global Confidence;
D O I：
10.1007/s11018-005-0194-x
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Statement by the director of the International Bureau of Weights and Measures, Professor Andrew Vollard, on World Metrology Day, May 20, 2005
引用
收藏
页码：629 / 631
页数：3
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