Reduction in the Photoluminescence Intensity Caused by Ultrathin GaN Quantum Barriers in InGaN/GaN Multiple Quantum Wells

被引:3
|
作者
Liu, Wei [1 ]
Liang, Feng [2 ]
Zhao, Degang [2 ,3 ]
Yang, Jing [2 ]
Chen, Ping [2 ]
Liu, Zongshun [2 ]
机构
[1] Northwestern Polytech Univ, Sch Microelect, Xian 710072, Peoples R China
[2] Univ Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
[3] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
基金
中国国家自然科学基金; 国家重点研发计划;
关键词
InGaN; GaN multiple quantum wells; photoluminescence; barrier thickness; carrier recombination; semiconductor crystal quality; STABILITY;
D O I
10.3390/cryst12030339
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The optical properties of InGaN/GaN violet light-emitting multiple quantum wells with different thicknesses of GaN quantum barriers are investigated experimentally. When the barrier thickness decreases from 20 to 10 nm, the photoluminescence intensity at room temperature increases, which can be attributed to the reduced polarization field in the thin-barrier sample. However, with a further reduction in the thickness to 5 nm, the sample's luminescence intensity decreases significantly. It is found that the strong nonradiative loss process induced by the deteriorated crystal quality and the quantum-tunneling-assisted leakage of carriers may jointly contribute to the enhanced nonradiative loss of photogenerated electrons and holes, leading to a significant reduction in photoluminescence intensity of the sample with nanoscale ultrathin GaN quantum barriers.
引用
收藏
页数:9
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