Calculating Parameters of Pinhole in Collimation System of Albedo Computed Tomography of Steel Products

被引：1
|
作者：
Zhuravskii, E. E. [1 ]
Kapranov, B. I. [1 ]
Belkin, D. S. [1 ]
Chakhlov, S. V. [1 ]
Shtein, A. M. [1 ]
机构：
[1] Tomsk Polytech Univ, Tomsk 634050, Russia
来源：
RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING | 2020年 / 56卷 / 02期
关键词：
Compton tomography; collimation system; pinhole; nondestructive testing; radiation testing; flaw detection; instrument making;
D O I：
10.1134/S1061830920020102
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We examine specific features of the collimation system of a tomograph for testing steel products based on Compton backscattering. The device is described and the parameters of the primary pinhole collimator of the collimation system are calculated. The device allows reliable scanning of a steel test object by simply displacing the pinhole perpendicular to the X-ray axis from the tube anode within 50 mm with a focal length of 163 mm.
引用
收藏
页码：171 / 178
页数：8
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