XPAD:: Pixel detector for material sciences

被引：17
|
作者：
Basolo, S [1 ]
Bérar, JF
Boudet, N
Breugnon, P
Caillot, B
Clemens, JC
Delpierre, P
Dinkespiler, B
Koudobine, I
Meessen, C
Menouni, A
Mouget, C
Pangaud, P
Potheau, R
Vigeolas, E
机构：
[1] CPPM, IN2P3, Marseille, France
[2] D2AM, CRG, ESRF, Grenoble, France
[3] CNRS, Lab Cristallo, Grenoble, France
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2005年 / 52卷 / 05期
关键词：
detector; pixel; powder diffraction; SAXS; synchrotron;
D O I：
10.1109/TNS.2005.856818
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Currently available 2D detectors do not make full use of the high flux and high brilliance of third generation synchrotron sources. The XPAD prototype, using active pixels, has been developed to fulfill the needs of materials science scattering experiments. At the time, its prototype is build of eight modules of eight chips. The threshold calibration of approximate to 4 10(4) pixels is discussed. Applications to powder diffraction or SAXS experiments prove that it allows to record high quality data.
引用
收藏
页码：1994 / 1998
页数：5
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