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- [6] Electrical modeling and characterization of 3-D vias PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10, 2008, : 784 - 787
- [7] Modeling and Analysis of Die-to-Die Vertical Coupling in 3-D IC 2009 11TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC 2009), 2009, : 707 - +
- [8] High Thermal Conductive Die Attach Material Process Characterization Challenges PROCEEDINGS OF THE 2013 IEEE 15TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC 2013), 2013, : 831 - 835
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