Enhanced Angle Sensitive Pixels for Light Field Imaging

被引：0

作者：

Sivaramakrishnan, Sriram ^{[1
]}

Wang, Albert ^{[1
]}

Gill, Patrick R. ^{[1
]}

Molnar, Alyosha ^{[1
]}

机构：

[1] Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

来源：

2011 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) | 2011年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Previously demonstrated angle sensitive pixels (ASPs) have been shown to enable integrated digital light-field imaging in CMOS, but suffer from significantly reduced pixel quantum efficiency and increased sensor size. This work demonstrates ASP devices that use phase gratings and a pair of interleaved diodes to double pixel density and improve quantum efficiency by a factor of 4.

引用

页数：4

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