Single Event Transients in 28-nm CMOS Decoders

被引：0
|
作者：
Stenin, Vladimir Ya. [1 ,2 ]
Levin, Konstantin E. [1 ,2 ]
机构：
[1] Natl Res Nucl Univ MEPhI, Moscow Engn Phys Inst, Moscow, Russia
[2] Russian Acad Sci, Sci Res Inst Syst Anal, Moscow, Russia
来源：
2016 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON) | 2016年
关键词：
coders; decoders; noise immunity; logical element; single nuclear particle; error correction; simulation; SETS;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
RAM decoders were simulated on base the bulk CMOS 28-nm design rule. The result of a single nuclear particle impact on a MOS logical gate is a noise pulse as a single-event transient. The internal error decoder gives the main contribution to a noise sensibility of a RAM decoder. The combinational logic of error decoder can prevent all noise pulse propagating through NAND and NOR gates for the output state 0 of bits error decoder by masking and quenching.
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页数：5
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