A New Ageing-Aware Approach via Path Isolation

被引：0
|
作者：
Lu, Yue [1 ]
Duan, Shengyu [1 ]
Kazmierski, Tom J. [1 ]
机构：
[1] Univ Southampton, Sch Elect & Comp Engn, Southampton SO17 1BJ, Hants, England
来源：
PROCEEDINGS OF THE 2018 FORUM ON SPECIFICATION & DESIGN LANGUAGES (FDL) | 2018年
关键词：
RELIABILITY; LOGIC;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
NBTI is becoming one of the major circuit reliability issues in nano-scale technologies. BTI can cause a threshold voltage shift in CMOS devices and consequently increase circuit delay. This paper proposed a novel ageing aware approach to improve circuit's lifetime. The vulnerable circuit paths against ageing effects are isolated. In addition, minimum area overhead is consumed by adopting proposed synthesis algorithm. The simulation results show that the proposed approach can save up to 67.7% area compared with the conventional over-design technique.
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页数：5
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