Exchange property correlation on deposition gas species and interface structure of Ion Beam Deposited Ta(50Å)/NiFe(xÅ)/FeMn(yÅ)/Ta(50Å) layers

被引：0

作者：

Hegde, H ^{[1
]}

Wang, J ^{[1
]}

Sant, SB ^{[1
]}

机构：

[1] Veeco Instruments Inc, Plainview, NY 11803 USA

来源：

HIGH-DENSITY MAGNETIC RECORDING AND INTEGRATED MAGNETO-OPTICS: MATERIALS AND DEVICES | 1998年 / 517卷

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the quest for giant magnetoresistance exchange biased spin valves, the exchange coupling at the interface between the ferromagnetic layer and the antiferromagnetic layer is critical. We have correlated the exchange property, in ion beam deposited Ta (50 Angstrom) / NiFe (x Angstrom) / FeMn (y Angstrom) / Ta (50 Angstrom) layers, as a function of the deposition gas species, beam energy, deposition angle and resultant interface structures. High-resolution transmission electron microscopy was employed to understand the role of interface roughness, grain size of individual layers, towards optimization of the exchange behavior. Under certain conditions, exchange fields >300 Oe were consistently obtained for NiFe and FeMn thickness of 50 Angstrom and 100 Angstrom respectively. To the best of our knowledge, exchange-coupling strength of 0.25 ergs/cm(2) so obtained is the highest for such structures.

引用

页码：49 / 54

页数：6