In-situ stress and strain measurements around cracks using synchrotron X-ray diffraction

被引：8
|
作者：
Steuwer, A. [1 ,2 ]
Daniels, J. E. [3 ]
机构：
[1] ESS Scandinavia AB, S-22100 Lund, Sweden
[2] NMMU, Port Elizabeth, South Africa
[3] Univ New S Wales, Sydney, NSW, Australia
来源：
JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN | 2011年 / 46卷 / 07期
关键词：
synchrotron X-ray diffraction; fracture mechanics; residual stress; crack growth; RESIDUAL-STRESS; FATIGUE CRACKS; TOMOGRAPHY; TIP; GROWTH; ZONE; SLIT;
D O I：
10.1177/0309324711408501
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
High-energy synchrotron X-ray diffraction offers the unique combination of high spatial resolution and bulk material penetration power, which is well suited for the investigation of strain fields around cracks in engineering materials. The speed of data acquisition also lends itself to the observation of in-situ processes, such as crack propagation. This potential has been only partially explored over the last decade, and this paper reviews some basic advances with a view to future developments.
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页码：593 / 606
页数：14
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