Control and precise measurement of carrier-envelope phase dynamics

被引：43
|
作者：
Witte, S [1 ]
Zinkstok, RT [1 ]
Hogervorst, W [1 ]
Eikema, KSE [1 ]
机构：
[1] Vrije Univ Amsterdam, Ctr Laser, Atom & Laser Phys Grp, NL-1081 HV Amsterdam, Netherlands
来源：
APPLIED PHYSICS B-LASERS AND OPTICS | 2004年 / 78卷 / 01期
关键词：
D O I：
10.1007/s00340-003-1307-3
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The evolution of the carrier-envelope offset phase phi(CEO) of a 10-fs Ti:Sapphire laser has been traced on time scales from microseconds to seconds using various techniques. Precise locking of this phase has been achieved down to an rms deviation of 1/40 of an optical cycle. Stability measurements have been performed independently of the feedback loop, focusing on the phase jitter introduced by the feedback loop itself, the pump laser, and a prism compressor. It is shown that a multi-mode pump laser introduces more phase noise on phi(CEO) than a single-mode pump laser.
引用
收藏
页码：5 / 12
页数：8
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