Phase characterization of two-tone intermodulation distortion

被引：9
|
作者：
Crespo-Cadenas, C [1 ]
Reina-Tosina, J [1 ]
Madero-Ayora, MJ [1 ]
机构：
[1] Univ Seville, Escuela Super Ingn, Seville 41092, Spain
来源：
2005 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM, VOLS 1-4 | 2005年
关键词：
two-tone test setup; electrical memory effects; IM products; phase asymmetries; Volterra series; amplifier distortion;
D O I：
10.1109/MWSYM.2005.1516979
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An automated setup for the characterization or phase asymmetries in nonlinear microwave circuits under two-tone excitation is presented. The method includes a novel approach to generate two synchronized tones with the same amplitude and phase using an arbitrary-waveform signal generator. Special attention is devoted to the evaluation of two-tone MID impairments as a consequence of memory effects and assess its dependence on their separation in frequency. Experimental results over a HEMT amplifier exhibiting phase asymmetries are compared with standard two-tone measurements and show that the accuracy of this procedure is good, with negligible non-systematic errors.
引用
收藏
页码：1505 / 1508
页数：4
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