Characterization of CeO2 thin films on a sapphire

被引:1
|
作者
Sokolov, SV [1 ]
Knotko, AV [1 ]
Putlayev, VI [1 ]
Kaul, AR [1 ]
机构
[1] Moscow MV Lomonosov State Univ, Dept Chem, Moscow 119899, Russia
关键词
thin film; CeO2; sapphire; electron microscopy; x-ray diffraction;
D O I
10.1006/spmi.1996.0433
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Thin layers of CeO2 were deposited on the R-plane of a sapphire substrate. The films were tested by x-ray diffraction, scanning electron microscopy and transmission electron microscopy techniques. The films were found to be epitaxial with fine-grain morphology of the surface. (C) 1998 Academic Press.
引用
收藏
页码:49 / 53
页数:5
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