HgCdTe Long-Wave Infrared Detectors

被引：6
|
作者：
Rhiger, David R. [1 ]
机构：
[1] Raytheon Vis Syst, Goleta, CA 93117 USA
来源：
ADVANCES IN INFRARED PHOTODETECTORS | 2011年 / 84卷
关键词：
SPECTROSCOPIC ELLIPSOMETRY; NONDESTRUCTIVE ANALYSIS; PHOTODIODES;
D O I：
10.1016/B978-0-12-381337-4.00006-1
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：303 / 331
页数：29
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