SWITCHING MAGNETIZATION MAGNETIC FORCE MICROSCOPY - AN ALTERNATIVE TO CONVENTIONAL LIFT-MODE MFM

被引：8

作者：

Cambel, Vladimir ^{[1
]}

Gregusova, Dagmar

Elias, Peter ^{[1
]}

Fedor, Jan ^{[1
]}

Kostic, Ivan ^{[2
]}

Manka, Jan ^{[3
]}

Ballo, Peter ^{[4
]}

机构：

[1] Slovak Acad Sci, Inst Elect Engn, Bratislava 84104, Slovakia

[2] Slovak Acad Sci, Inst Informat, Bratislava 84104, Slovakia

[3] Slovak Acad Sci, Inst Measurement Sci, Bratislava 84104, Slovakia

[4] Slovak Univ Technol Bratislava, Fac Elect Engn & Informat Technol, Bratislava 81219, Slovakia

来源：

JOURNAL OF ELECTRICAL ENGINEERING-ELEKTROTECHNICKY CASOPIS | 2011年 / 62卷 / 01期

关键词：

magnetic force microscopy; micromagnetic calculations; switching field; RESOLUTION; ELEMENTS; NANOSTRUCTURES; TIPS;

D O I：

10.2478/v10187-011-0006-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM tips and by lowering the lift height. Although smaller lift height offers improved spatial resolution, we show that lowered tip-sample distance mixes magnetic, atomic and electric forces. We describe an alternative to the lift-mode procedure - Switching Magnetization Magnetic Force Microscopy [SM-MFM], which is based on two-pass scanning in tapping mode AFM with reversed tip magnetization between the scans. We propose design and calculate the magnetic properties of such SM-MFM tips. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. The switching field of such tips is calculated for Permalloy hexagons.

引用

页码：37 / 43

页数：7

共 50 条

[1] Force gradient sensitive detection in lift-mode Kelvin probe force microscopy
Ziegler, Dominik
Stemmer, Andreas
NANOTECHNOLOGY, 2011, 22 (07)
[2] Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy
Van der Hofstadt, M.
Fabregas, R.
Biagi, M. C.
Fumagalli, L.
Gomila, G.
NANOTECHNOLOGY, 2016, 27 (40)
[3] Magnetic elements for switching magnetization magnetic force microscopy tips
Cambel, V.
Elias, P.
Gregusova, D.
Martaus, J.
Fedor, J.
Karapetrov, G.
Novosad, V.
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2010, 322 (18) : 2715 - 2721
[4] High resolution switching magnetization magnetic force microscopy
Cambel, V.
Precner, M.
Fedor, J.
Soltys, J.
Tobik, J.
Scepka, T.
Karapetrov, G.
APPLIED PHYSICS LETTERS, 2013, 102 (06)
[5] Novel Magnetic Tips Developed for the Switching Magnetization Magnetic Force Microscopy
Cambel, V.
Elias, P.
Gregusova, D.
Fedor, J.
Martaus, J.
Karapetrov, G.
Novosad, V.
Kostic, I.
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2010, 10 (07) : 4477 - 4481
[6] The inverse problem in magnetic force microscopy-inferring sample magnetization from MFM images
Rawlings, Colin
Durkan, Colm
NANOTECHNOLOGY, 2013, 24 (30)
[7] Applications of tip calibration in magnetic force microscopy (MFM)
Van Schendel, PJA
Hug, HJ
Hoffmann, R
Martin, S
Kappenberger, P
Lantz, MA
Güntherodt, HJ
MAGNETIC STORAGE SYSTEMS BEYOND 2000, 2001, 41 : 313 - 316
[8] On the determination of the stray field structure by magnetic force microscopy (MFM)
Breczko, T
Bramowicz, M
SEVENTH INTERNATIONAL WORKSHOP ON NONDESTRUCTIVE TESTING AND COMPUTER SIMULATIONS IN SCIENCE AND ENGINEERING, 2004, 5400 : 24 - 29
[9] Micromagnetic properties and magnetization switching of single domain Co dots studied by magnetic force microscopy
Lohndorf, M
Wadas, A
Lutjering, G
Weiss, D
Wiesendanger, R
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1996, 101 (01): : 1 - 2
[10] Characterization of domain switching behavior of MTJ cells using magnetic force microscopy (MFM) and H-R loop analysis
Heo, Jinhee
Kim, Kyohyeok
Kim, Taewan
Chung, Ilsub
IEEE NMDC 2006: IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE 2006, PROCEEDINGS, 2006, : 618 - +

← 1 2 3 4 5 →