New Method to Solve the End Effect of Empirical Mode Decomposition

被引：0
|
作者：
Zhang Leitao [1 ]
Chen Huanguo [1 ]
Li Jianmin [1 ]
Chen Wenhua [1 ]
机构：
[1] Zhejiang Sci Tech Univ, Sch Mech & Automat Control, Hangzhou, Zhejiang, Peoples R China
来源：
PROCEEDINGS OF THE 2009 2ND INTERNATIONAL CONGRESS ON IMAGE AND SIGNAL PROCESSING, VOLS 1-9 | 2009年
关键词：
EMD; end effect; end sifting method;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
The end sifting method has been proposed to solve the end effect problem of Empirical Mode Decomposition (EMD). During the Intrinsic Mode Function (IMF) sifting process by EMD method, a procedure including end effect judgment and end sifting, which is different from the traditional idea dealing with the problem by dictating or predicting an end point, is added. This method has greatly improved the precision of IMF.
引用
收藏
页码：4789 / 4793
页数：5
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