Data quality monitoring of the CMS Silicon Strip Tracker detector

被引:0
|
作者
Benucci, L. [1 ]
机构
[1] Univ Antwerp, Antwerp, Belgium
关键词
Data quality monitoring; Silicon Strip Tracker; CMS;
D O I
10.1016/j.nima.2009.06.106
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The Physics and Data Quality Monitoring (DQM) framework aims at providing a homogeneous monitoring environment across various applications related to data taking at the CMS experiment. In this contribution, the DQM system for the Silicon Strip Tracker will be introduced. The set of elements to assess the status of detector will be mentioned, along with the way to identify problems and trace them to specific tracker elements. Monitoring tools, user interfaces and automated software will be briefly described. The system was used during extensive cosmic data taking of CMS in Autumn 2008, where it demonstrated to have a flexible and robust implementation and has been essential to improve the understanding of the detector. CMS Collaboration believes that this tool is now mature to face the forthcoming data-taking era. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:523 / 525
页数:3
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