3D elemental sensitive imaging by full-field XFCT

被引:22
|
作者
Deng, Biao [1 ]
Du, Guohao [1 ]
Zhou, Guangzhao [1 ]
Wang, Yudan [1 ]
Ren, Yuqi [1 ]
Chen, Rongchang [1 ]
Sun, Pengfei [1 ]
Xie, Honglan [1 ]
Xiao, Tiqiao [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201204, Peoples R China
基金
中国国家自然科学基金;
关键词
COMPUTED-TOMOGRAPHY XFCT; RAY; PINHOLE;
D O I
10.1039/c4an02401j
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
X-ray fluorescence computed tomography (XFCT) is a stimulated emission tomography modality that maps the three-dimensional (3D) distribution of elements. Generally, XFCT is done by scanning a pencilbeam across the sample. This paper presents a feasibility study of full-field XFCT (FF-XFCT) for 3D elemental imaging. The FF-XFCT consists of a pinhole collimator and X-ray imaging detector with no energy resolution. A prototype imaging system was set up at the Shanghai Synchrotron Radiation Facility (SSRF) for imaging the phantom. The first FF-XFCT experimental results are presented. The cadmium (Cd) and iodine (I) distributions were reconstructed. The results demonstrate FF-XFCT is fit for 3D elemental imaging and the sensitivity of FF-XFCT is higher than a conventional CT system.
引用
收藏
页码:3521 / 3525
页数:5
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