STM (AFM) tip testing by Rutherford backscattering

被引：0
|
作者：
Dedkov, GV
Rekhviashvili, SS
机构：
来源：
PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES: REVIEW AND SHORT NOTES TO NANOMEETING '97 | 1997年
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
It is shown that geometrical parameters of the STM (AFM) tips can be successfully determined using Rutherford backscattering technique.
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页码：255 / 258
页数：4
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