X-ray analysis of self-organized InAs/InGaAs quantum dot structure

被引:0
|
作者
Krost, A [1 ]
Heinrichsdorff, F
Bimberg, D
Bläsing, J
Darhuber, A
Bauer, G
机构
[1] Tech Univ Berlin, Inst Festkorperphys, D-10623 Berlin, Germany
[2] Univ Magdeburg, Inst Expt Phys, D-39016 Magdeburg, Germany
[3] Johannes Kepler Univ, Inst Halbleiterphys, A-4040 Linz, Austria
关键词
D O I
10.1002/(SICI)1521-4079(199901)34:1<89::AID-CRAT89>3.3.CO;2-L
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We report on an X-ray study of an InAs/InGaAs/GaAs multi quantum dot stack grown by metalorganic chemical vapor deposition using grazing incidence reflectometry, high-resolution X-ray diffraction, reciprocal space mapping and pole figure analysis. No direct signal from the quantum dots is found by the high-resolution techniques. All rocking curves on different symmetric and asymmetric Bragg reflections can be simulated within the framework of dynamical theory assuming a perfect tretragonally distorted InAs/InGaAs/GaAs multiquantum well system. A pole figure analysis in the vicinity of the (113) and (022) reflections, however, reveals a signal from the quantum dots. There is a considerable indium enrichment in the quantum dots as compared to the wetting layer indicating a strong In-diffusion during their formation. Moreover, a strongly anisotropic diffuse scattering distribution with respect to the [110] and [1 (1) over bar 0] directions is found.
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页码:89 / 102
页数:14
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