Double bent crystal dispersive arrangement for high resolution diffractometry

被引：5
|
作者：
Mikula, P. [1 ]
Vrana, M. [1 ]
Saroun, J. [1 ]
Em, V.
Seong, B. S.
Woo, W.
机构：
[1] Nucl Phys Inst ASCR, Vvi, Rez 25068, Czech Republic
来源：
5TH EUROPEAN CONFERENCE ON NEUTRON SCATTERING | 2012年 / 340卷
关键词：
ANGLE NEUTRON-SCATTERING; SANS EXPERIMENTS; DIFFRACTION; MONOCHROMATORS;
D O I：
10.1088/1742-6596/340/1/012014
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
In this paper some properties of the dispersive double-bent-crystal setting are described. Thanks to an easy manipulation with focusing of the monochromatic beam, high reflection probability of both bent crystals and very narrow (1-3 mm) obtained monochromatic beam such an arrangement could be attractive for an employment. We tested the properties of the double-bent-crystal setting of the bent Si(111) + bent Si(220) slabs on the diffractometer at the neutron wavelength of 0.163 nm for various curvatures of the Si(220) slabs. By using a standard polycrystalline sample of Fe it has been found that besides an excellent resolution the neutron current is sufficient even for powder diffraction experiments.
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页数：6
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