Verification of the short-circuit current making capability of high-voltage switching devices

被引:5
|
作者
Smeets, RPP [1 ]
van der Linden, WA [1 ]
机构
[1] KEMA High Power Lab, Arnhem, Netherlands
关键词
(AC) circuit breakers; arc discharges; circuit breaker testing; circuit transient analysis; short circuit currents; switchgear testing; switching transients;
D O I
10.1109/61.956746
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Switching-in of short-circuit current leads to pre-arcing in the switching device. Pre-arcing affects the ability of switchgear to close and latch. In three-phase systems, making is associated with transient voltage phenomena that may have a significant impact on the duration of the pre-arcing period. An analysis is presented of these transients. It was found that pre-arcing times in three-phase systems can be considerably prolonged with respect to a single phase situation. On the other hand, it is demonstrated that the three-phase interaction has a moderating influence on the peak value of asymmetrical current. A test-circuit is described, able to perform three-phase synthetic make tests up to 245 kV at current up to 63 kA, representing all transient phenomena. Specific tests are described requiring the maximum available laboratory power: one with a circuit breaker subjected to direct test and one with a high-speed grounding switch subjected to synthetic tests.
引用
收藏
页码:611 / 618
页数:8
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