Track etch parameters and annealing kinetics assessment of protons of low energy in CR-39 detector

被引:15
|
作者
Jain, R. K. [2 ]
Kumar, Ashok [1 ,2 ]
Singh, B. K. [3 ]
机构
[1] Vidya Coll Engn, Dept Appl Sci Phys, Meerut 250010, Uttar Pradesh, India
[2] Shobhit Univ, Dept Phys, Sch Basic & Appl Sci, Meerut 250110, Uttar Pradesh, India
[3] Banaras Hindu Univ, Dept Phys, High Energy Phys Lab, Varanasi 221005, Uttar Pradesh, India
关键词
CR-39; plastic; Mini proton accelerator; Etching; Annealing; RESOLUTION; POLYMER;
D O I
10.1016/j.nimb.2011.11.045
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this paper threshold of the registration sensitivity of very low energy proton in CR-39 is investigated. Irradiation of CR-39 (poly-allyl-diglycol carbonate) was carried out with very low energy mono energetic protons of 20-60 keV from a mini proton accelerator. Nearly 10(4)/cm(2) fluence of protons was used. The variation of track diameter with etching time as well as proton energy response curve was carefully calibrated. The bulk and track etch rates were measured by using proton track diameters. Bulk etch rate was also measured by the thickness of removed surface layer. The thermal annealing of proton track at temperatures ranging from 100 to 200 degrees C in CR-39 was studied by several models. Activation energy of annealed CR-39 detectors was calculated by slope of track etch rate and temperature plot. The data of proton tracks of 200, 250 and 300 keV from 400 kV Van-de-Graaff accelerator was also used and compared with the track diameters of different energies of proton. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:100 / 104
页数:5
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