Analysis of mechanical and electrical straining effects on TFRs - Statistical bimodal conductance approach

被引：1
|
作者：
Stanimirovic, Z. [1 ]
Jevtic, M. M. [2 ]
Stanimirovic, I. [1 ]
机构：
[1] IRITEL, AD Batanjnicki Put 23, Belgrade, Serbia
[2] Inst Phys, Belgrade 11080, Serbia
来源：
2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS | 2008年
关键词：
D O I：
10.1109/ICMEL.2008.4559351
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper statistical approach to analysis of mechanically and electrically strained TFRs will be presented using parameters from deterministic model. Noise performances of stained resistors will be explained using redistribution of numbers of contacts and MIM cells as well as adequate contributions of noise due to metallic conduction and noise due to fluctuations in MIM cells to total noise of strained resistor.
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页码：575 / +
页数：2
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