Resonance modes of voltage-modulated scanning force microscopy

被引：12
|
作者：
Labardi, M. [1 ]
Likodimos, V. [1 ]
Allegrini, M. [1 ]
机构：
[1] Unita Pisa Univ, INFM, I-56127 Pisa, Italy
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2001年 / 72卷 / Suppl 1期
关键词：
PACS: 61.16Ch;
D O I：
10.1007/s003390100631
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Mechanical resonance modes of the scanning force microscope (SFM) cantilever in contact conditions provide contrast enhancement in the imaging of surface charges when using voltage modulation techniques tuned to such resonances. Extensions of the method were made as regards the lateral (twisting) and frontal (buckling) modes of the cantilever, as well as the enhanced second harmonic detection of voltage-modulated response at resonance and near-resonance detection in the SFM tapping mode. As an example of application, vibration spectra and images taken on a triglycine sulfate (TGS) single crystal are discussed.
引用
收藏
页码：S79 / S85
页数：7
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